Department of Physics

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Browsing Department of Physics by Author "Phase, D. M."

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    Magnetic Properties of Textured Nanocrystalline Mn-Zn Ferrite Thin Films Fabricated by Pulsed Laser Deposition.Thin Films Fabricated by Pulsed Laser Deposit
    (Natural Sciences Publishing, 2014) Joseph, Jaison; Tangsali, R. B.; Choudhary, R. J.; Phase, D. M.; Ganeshan, V.
    MnxZn1-xFe2O4 nanoparticles were chemically synthesized by co- precipitating metal ions in alkaline aqueous solutions. The XRD peaks match up to spinel ferrites without any multi phase indication and clear visibility of ferrite FT-IR absorption bands confirm single phase spinal formation. Particle size derived from XRD data is authenticated by TEM micrographs. Thin films fabricated from this material on quartz substrate by pulse laser deposition were characterised using XRD. The XRD data revealed formation of spinel structure with a reasonable degree of texture. AFM analysis confirms nano granular film morphology with dimensions comparable to that of target grain. Magnetic data obtained from textured nanocrystalline Mn-Zn ferrite thin film measurements made known enhanced coercivity. The observed enhanced coercivity is explained with due consideration of film texture and surface disorder that originated from Mn concentration specific initial adsorption prior to nucleation, resulting in directional film growth.
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    Microstructure and magnetic properties of patterned nano crystalline zinc ferrite thin film fabricated by pulse laser deposition
    (Elsevier, 2015) Joseph, Jaison; Tangsali, R. B.; Mahadevan Pillai, V. P.; Choudhary, R. J.; Phase, D. M.; Ganeshan, V.
    Patterned nano crystalline ZnFe2O4 thin film was fabricated on quartz substrate by pulse laser deposition. XRD and Raman spectroscopic techniques were employed for structural characterization of the film. Silencing of a small number of prominent ferrite XRD peaks in thin film signify mild textured film growth. The observed XRD peak position swing with respect to the target material in thin film indicates formation of lateral strain in opposite directions during film growth. The thin film XRD peak position shift with target material data as reference is explained by suggesting an appropriate film growth model. Designated ferrite Raman emission peaks originated from film surface authenticates the stoichiometric and structural stability of ferrite material. AFM images indicate specific pattern formation with nanogranular morphology. Magnetic property measurements of the thin film revealed enhanced properties which are explained on the basis of texture, lattice strain, and surface features that are originated from patterned thin film growth.
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    Structure and magnetic properties of highly textured nanocrystalline Mn–Zn ferrite thin film
    (Elsevier, 2015) Joseph, Jaison; Tangsali, R. B.; Mahadevan Pillai, V. P.; Choudhary, R. J.; Phase, D. M.; Ganeshan, V.
    Nanoparticles of Mn0.2Zn0.8Fe2O4 were chemically synthesized by co-precipitating the metal ions in aqueous solutions in a suitable alkaline medium. The identified XRD peaks confirm single phase spinal formation. The nanoparticle size authentication is carried out from XRD data using Debye Scherrer equation. Thin film fabricated from this nanomaterial by pulse laser deposition technique on quartz substrate was characterized using XRD and Raman spectroscopic techniques. XRD results revealed the formation of high degree of texture in the film. AFM analysis confirms nanogranular morphology and preferred directional growth. A high deposition pressure and the use of a laser plume confined to a small area for transportation of the target species created certain level of porosity in the deposited thin film. Magnetic property measurement of this highly textured nanocrystalline Mn–Zn ferrite thin film revealed enhancement in properties, which are explained on the basis of texture and surface features originated from film growth mechanism.